Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
We use the method of probability-weighted moments to derive estimators of the parameters and quantiles of the generalized extreme-value distribution. We investigate the properties of these estimators in large samples, via asymptotic theory, and in small and moderate samples, via computer simulation. Probability-weighted moment estimators have low variance and no severe bias, and they compare favorably with estimators obtained by the methods of maximum likelihood or sextiles. The method of probability-weighted moments also yields a convenient and powerful test of whether an extreme-value distribution is of Fisher-Tippett Type I, II, or III. © 1985 Taylor & Francis Group, LLC.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Robert Manson Sawko, Malgorzata Zimon
SIAM/ASA JUQ
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
Jonathan Ashley, Brian Marcus, et al.
Ergodic Theory and Dynamical Systems