Epitaxial growth of C₆₀ thin films on mica

Abstract

Single crystal films of C60 of different thickness values have been deposited on mica substrates by resistance evaporation. Electron diffraction and high resolution microscopy have been used to assess the orientational ordering and the nature of the defects present in these face-centered cubic films which exhibit a (111) direction normal to the film surface. © 1992, Materials Research Society. All rights reserved.