R.R. Yu, F. Liu, et al.
VLSI Technology 2009
Paper
Dislocation-like defects in an amorphous Lennard-Jones solid
Abstract
Line defects in an amorphous Lennard-Jones solid have been studied using computer simulation techniques with static relaxation. It has been found that both edge and screw dislocations can be stably introduced into the model and can be moved through the model to form a diffuse step on the surface of the model. © 1986.
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