PaperLocal bonding and electronic structure obtained from electron energy loss scatteringP.E. Batson, K.L. Kavanagh, et al.Ultramicroscopy
Conference paperMaterials and process integration issues in metal gate/high-k stacks and their dependence on device performanceA.C. Callegari, K. Babich, et al.ECS Meeting 2007
PaperStructural and electronic characterization of a dissociated dislocation in GeSiP.E. BatsonPhysical Review B - CMMP