Conference paper
High resolution EELS in the IBM sub-angstrom STEM
P.E. Batson
M&M 2006
Paper
Direct determination of local lattice polarity in crystals
Abstract
A scanning transmission electron microscope reveals atomic-level columns of nitrogen and their polarity in an aluminum nitride with sub-angstrom resolution.
Related
Conference paper
Studies of EELS L2,3 absorption fine structure in thin silicon
P.E. Batson
Microscopy of Semiconducting Materials 1991
P.E. Batson
Microscopy and Microanalysis
S. Subramanian, D.A. Muller, et al.
Materials Science and Engineering A