Noah Sturcken, Eugene J. O'Sullivan, et al.
IEEE JSSC
As feature sizes decrease and clock frequencies increase, noise is becoming a greater concern in digital IC design. The authors describe a verification metric, noise stability, which guarantees functionality in the presence of noise, and a CAD technique, static noise analysis, for applying this metric on a chipwide basis.
Noah Sturcken, Eugene J. O'Sullivan, et al.
IEEE JSSC
Naigang Wang, Eugene J. O'Sullivan, et al.
Journal of Applied Physics
Steven C. Chan, Kenneth L. Shepard, et al.
ICCD 2003
Steven C. Chan, Kenneth L. Shepard, et al.
IEEE Journal of Solid-State Circuits