S.Y. Lin, G. Arjavalingam
Optics Letters
Paper
Characterization of Resistive Transmission Lines to 70 GHz with Ultrafast Optoelectronics
Abstract
The complete characterization of resistive transmission lines with the short-pulse propagation technique is extended to 70 GHz. The wide-frequency coverage is made possible by the use of ultrafast photoconductive switches for pulse generation and sampling. The picosecond optoelectronic sampling oscilloscope is described and results of measurements on thin-film strip transmission lines are presented. © 1993 IEEE
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