About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Paper
A Delay Metric for RC Circuits Based on the Weibull Distribution
Abstract
Physical synthesis optimizations require fast and accurate analysis of RC networks. Elmore first proposed matching circuit moments to a probability density function (PDF), which led to widespread adoption of his simple and fast metric. The more recently proposed PRIMO and H-gamma metrics match the circuit moments to the PDF of a Gamma statistical distribution. We instead propose to match the circuit moments to a Weibull distribution and derive a new delay metric called Weibull-based delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracy at both near- and far-end nodes.