Publications

15 results at IRPS 2015

SOI FinFET soft error upset susceptibility and analysis
- - Phil Oldiges
  - Ken Rodbell
  - et al.
- 2015
- IRPS 2015
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
- - C. Kothandaraman
  - X. Chen
  - et al.
- 2015
- IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- - Andrea Bahgat Shehata
  - Alan J. Weger
  - et al.
- 2015
- IRPS 2015
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
- - Robert M. Shelby
  - Geoffrey W. Burr
  - et al.
- 2015
- IRPS 2015
Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures
- - Milos Stanisavljevic
  - A. Athmanathan
  - et al.
- 2015
- IRPS 2015
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- - Mukta Farooq
  - Giuseppe La Rosa
  - et al.
- 2015
- IRPS 2015
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- - Ernest Y. Wu
  - James Stathis
  - et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- - Abu Sebastian
  - Daniel Krebs
  - et al.
- 2015
- IRPS 2015
TSV/FET proximity study using dense addressable transistor arrays
- - Raphael P. Robertazzi
  - Kanak Agarwal
  - et al.
- 2015
- IRPS 2015