Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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Year

15 results at IRPS 2015

A case study of electromigration reliability: From design point to system operations
- - Baozhen Li
  - Paul Muller
  - et al.
- 2015
- IRPS 2015
Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET
- - Miaomiao Wang
  - Zuoguang Liu
  - et al.
- 2015
- IRPS 2015
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- - Pong-Fei Lu
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- - Andrea Bahgat Shehata
  - Alan J. Weger
  - et al.
- 2015
- IRPS 2015
Analyzing path delays for accelerated testing of logic chips
- - Emily Ray
  - Barry P. Linder
  - et al.
- 2015
- IRPS 2015
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
- - Robert M. Shelby
  - Geoffrey W. Burr
  - et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
A method for rapid screening of various low-k TDDB models
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- IRPS 2015
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
- - C. Kothandaraman
  - X. Chen
  - et al.
- 2015
- IRPS 2015
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- - Mukta Farooq
  - Giuseppe La Rosa
  - et al.
- 2015
- IRPS 2015