Publications

15 results at IRPS 2015

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- - Abu Sebastian
  - Daniel Krebs
  - et al.
- 2015
- IRPS 2015
TSV/FET proximity study using dense addressable transistor arrays
- - Raphael P. Robertazzi
  - Kanak Agarwal
  - et al.
- 2015
- IRPS 2015
Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures
- - Milos Stanisavljevic
  - A. Athmanathan
  - et al.
- 2015
- IRPS 2015
A method for rapid screening of various low-k TDDB models
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- IRPS 2015
Analyzing path delays for accelerated testing of logic chips
- - Emily Ray
  - Barry P. Linder
  - et al.
- 2015
- IRPS 2015
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- - Pong-Fei Lu
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET
- - Miaomiao Wang
  - Zuoguang Liu
  - et al.
- 2015
- IRPS 2015
A case study of electromigration reliability: From design point to system operations
- - Baozhen Li
  - Paul Muller
  - et al.
- 2015
- IRPS 2015
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
- - Robert M. Shelby
  - Geoffrey W. Burr
  - et al.
- 2015
- IRPS 2015