Twin boundaries parallel to the common-{111} plane in spinel
- C.B. Carter
- Z. Elgat
- et al.
- 1987
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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51 results at Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Hillock growth kinetics in thin Pb-In-Au films
- H.-C.W. Huang
- P. Chaudhari
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Atomic structure of the epitaxial Al–Si interface
- F. Legoues
- W. Krakow
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Interdiffusion and precipitation in Al‒Hf thin-film couples
- M. Wittmer
- F. Legoues
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Observation and interpretation of the atomic structure of a [Sgrave] = 19/[110] (331) tilt boundary in Au thin films
- W. Krakow
- J.T. Wetzel
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
A dynamic lattice dislocation grain boundary sliding mechanism
- Keith Reading
- David A. Smith
- 1985
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
On the stability of vacancy and vacancy clusters in amorphous solids
- C.H. Bennett
- P. Chaudhari
- et al.
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Plastic properties of polycrystalline thin films on a substrate
- P. Chaudhari
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon
- H. Föll
- C.B. Carter
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Birefringence images of arbitrarily oriented dislocation lines in (111) silicon wafers
- D.A. Jenkins
- T.S. Plaskett
- et al.
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties