Publications

465 results at IEEE T-ED

On the Narrow-Emitter Effect of Advanced Shallow-Profile Bipolar Transistors
- - G.P. Li
  - C.T. Chuang
  - et al.
- 1988
- IEEE T-ED
Measurement of MOSFET Channel Potential Profile
- - Yew-Tong Yeow
- 1988
- IEEE T-ED
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- - Bruno Ricco
  - Piero Olivo
  - et al.
- 1988
- IEEE T-ED
Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- - Edward Hackbarth
  - Denny Duan-Lee Tang
- 1988
- IEEE T-ED
IVA-3 Surface Recombination in GaAlAs/GaAs Heterostructure Bipolar Transistors
- - Sandip Tiwari
  - David J. Frank
  - et al.
- 1988
- IEEE T-ED
Development and Experimental Verification of a Two-Dimensional Numerical Model of Piezoelectrically Induced Threshold Voltage Shifts in GaAs MESFET’s
- - Jean-Claude Ramirez
  - Patrick J. Mcnally
  - et al.
- 1988
- IEEE T-ED
The Potential of Complementary Heterostructure FET IC's
- - Richard A. Kiehl
  - W. Michael Kwapien
  - et al.
- 1987
- IEEE T-ED
Methodology for Bipolar Process Diagnosis and Its Application to Advanced Self-Aligned Bipolar Transistors
- - G.P. Li
  - E. Hackbarth
  - et al.
- 1987
- IEEE T-ED
IVA-5 Refractory p-Ohmic-Contact to GaAs and Ga_xAl₁ - _xAs (x ∼ 0.3) Based on Diffusion of Zn in a Rapid Thermal Furnace
- - Sandip Tiwari
  - Jeffrey Hintzman
  - et al.
- 1987
- IEEE T-ED
IIIB-5 Fabrication of Thin Gate Oxide MOSFET's Using Low-Temperature Plasma-Enhanced Chemical-Vapor-Deposited SiO₂
- - J. Li
  - J. Batey
  - et al.
- 1987
- IEEE T-ED