Measurement of MOSFET Channel Potential Profile
- Yew-Tong Yeow
- 1988
- IEEE T-ED
Publications
465 results at IEEE T-ED
On the Narrow-Emitter Effect of Advanced Shallow-Profile Bipolar Transistors
- G.P. Li
- C.T. Chuang
- et al.
- 1988
- IEEE T-ED
High-Field-Induced Degradation in Ultra-Thin SiO2 Films
- Piero Olivo
- Thao N. Nguyen
- et al.
- 1988
- IEEE T-ED
Waveform Measurements in High-Speed Silicon Bipolar Circuits Using a Picosecond Photoelectron Scanning Electron Microscope
- Paul May
- Jean-Marc Halbout
- et al.
- 1988
- IEEE T-ED
Junction Degradation in Bipolar Transistors and the Reliability Imposed Constraints to Scaling and Design
- Denny Duan-Lee Tang
- Edward Hackbarth
- 1988
- IEEE T-ED
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- Bruno Ricco
- Piero Olivo
- et al.
- 1988
- IEEE T-ED
An Advanced High-Performance Trench-Isolated Self-Aligned Bipolar Technology
- G.P. Li
- Tak H. Ning
- et al.
- 1987
- IEEE T-ED
IVA-5 Refractory p-Ohmic-Contact to GaAs and GaxAl1 - xAs (x ∼ 0.3) Based on Diffusion of Zn in a Rapid Thermal Furnace
- Sandip Tiwari
- Jeffrey Hintzman
- et al.
- 1987
- IEEE T-ED
VIA-8 High-Performance GaInAs Interdigitated-Metal-Semiconductor-Metal (IMSM) 1.3-µm Photodetector Grown on a GaAs Substrate
- D.L. Rogers
- J. Woodall
- et al.
- 1987
- IEEE T-ED
On the Resistivity of TiSi2: The Implication for Low-Temperature Applications
- Lia Krusin-Elbaum
- Jack Yuan-Chen Sun
- et al.
- 1987
- IEEE T-ED