STUDY OF AVALANCHE BREAKDOWN IN SCALED N-MOSFETS.
- S.E. Laux
- F.H. Gaensslen
- 1983
- IEDM 1983
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14 results for Fritz H. Gaensslen
Sensitive Technique for Measuring Small MOS Gate Currents
- F.H. Gaensslen
- J.M. Aitken
- 1980
- IEEE Electron Device Letters
1 µm MOSFET VLSI Technology: Part II-Device Designs and Characteristics for High-Performance Logic Applications
- Robert H. Dennard
- Fritz H. Gaensslen
- et al.
- 1979
- IEEE JSSC
Design of Ion-Implanted MOSFET's With Very Small Physical Dimensions
- Robert H. Dennard
- Fritz H. Gaensslen
- et al.
- 1974
- IEEE JSSC
Low temperature microelectronics
- F.H. Gaensslen
- R.C. Jaeger
- 1990
- SSDM 1990
A study of channel avalanche breakdown in scaled n-mosfet’s
- Steven E. Laux
- Fritz H. Gaensslen
- 1987
- IEEE T-ED
Nonuniform Displacement of MOSFET Channel Pinchoff
- Savvas G. Chamberlain
- Asim Husain
- et al.
- 1984
- IEEE T-ED
Nonuniform Displacement of MOSFET Channel Pinchoff
- Savvas G. Chamberlain
- Asim Husain
- et al.
- 1984
- IEEE Journal of Solid-State Circuits
An Efficient Numerical Algorithm for Simulation of MOS Capacitance
- Richard C. Jaeger
- Fritz H. Gaensslen
- et al.
- 1983
- IEEE TCADIS
Behavior of electrically small depletion mode MOSFETs at low temperature
- F.H. Gaensslen
- R.C. Jaeger
- 1981
- Solid-State Electronics