Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- ISSCC 2007
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51 results for Ching-Te Chuang
Relaxing conflict between read stability and writability in 6T SRAM cell using asymmetric transistors
- Jae-Joon Kim
- Aditya Bansal
- et al.
- 2009
- IEEE Electron Device Letters
Optimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Electron Device Letters
The impact of gate-oxide breakdown SRAM stability
- R. Rodríguez
- J.H. Stathis
- et al.
- 2002
- IEEE Electron Device Letters
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- IRPS 2009
A precise negative bias temperature instability sensor using slew-rate monitor circuitry
- Amlan Ghosh
- Richard B. Brown
- et al.
- 2009
- ISCAS 2009
Stable high-density FD/SOI SRAM with selective back-gate bias using dual buried oxide
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2008
- IEEE International SOI Conference 2008
Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008