Experiment and model for deviation from Pelgrom scaling relation in device width
- Ning Lu
- J. Brown
- et al.
- 2014
- IEDM 2014
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
23 results for Ning Lu
Efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- IEEE Electron Device Letters
Symmetry breaking in the drain current of multi-finger transistors
- Ning Lu
- Sungjae Lee
- et al.
- 2015
- CICC 2015
Modeling of resistance in FinFET local interconnect
- Ning Lu
- Pooja M. Kotecha
- et al.
- 2014
- CICC 2014
Virtual de-embedding study for the accurate extraction of Fin FET gate resistance
- Shireen Warnock
- Rob Groves
- et al.
- 2014
- CICC 2014
Gate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- S. Lee
- et al.
- 2013
- CICC 2013
An efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- NSTI-Nanotech 2013
Discreteness and distribution of drain currents in FinFETs
- Ning Lu
- 2012
- NSTI-Nanotech 2012
Characterization and modeling of metal finger capacitors
- Ning Lu
- Roger Booth
- et al.
- 2011
- NSTI-Nanotech 2011
Modeling of mismatch and across-chip variations in compact device models
- Ning Lu
- 2010
- Fluidics and Computational -/NSTI-Nanotech 2010