Conal E. Murray, K.L. Saenger, et al.
Journal of Applied Physics
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Conal E. Murray, K.L. Saenger, et al.
Journal of Applied Physics
Conal E. Murray, T. Graves-Abe, et al.
Applied Physics Letters
Kazuya Ohuchi, Christian Lavoie, et al.
IWJT 2008
Conal E. Murray
Applied Physics Letters