Comparison of heat outflow in dense sub-14nm contemporary NFETs: Bulk/SOI, inserted-oxide FinFET and nanowire FET
- Ishita Jain
- Anshul Gupta
- et al.
- 2016
- ICEE 2016
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7 results for Anil K. Bansal
7-nm Nanowire FET process variation modeling using industry standard BSIM-CMG model
- R. Singh
- K. Aditya
- et al.
- 2016
- ICEE 2016
Nanowire FET design for 7-nm SOI-CMOS technology
- Ishita Jain
- Anil K. Bansal
- et al.
- 2015
- S3S 2015
Series Resistance Reduction with Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET
- Anil K. Bansal
- Manoj Kumar
- et al.
- 2018
- IEEE T-ED
3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes
- Anil K. Bansal
- Charu Gupta
- et al.
- 2018
- IEEE T-ED
Analytical Modeling of Parasitic Capacitance in Inserted-Oxide FinFETs
- R. Singh
- Anshul Gupta
- et al.
- 2017
- IEEE T-ED
Series resistance reduction in stacked nanowire FETs for 7-nm CMOS technology
- Anil K. Bansal
- Ishita Jain
- et al.
- 2016
- IEEE J-EDS