In Situ Reflection Electron Microscopy of Ge Island Nucleation on Mesa Structures
- F.M. Ross
- M. Kammler
- et al.
- 2004
- Microscopy and Microanalysis
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13 results for Martin Kammler
Lateral control of self-assembled island nucleation by focused-ion-beam micropatterning
- M. Kammler
- R. Hull
- et al.
- 2003
- Applied Physics Letters
High concentration Bi δ-doping layers on Si(001)
- J. Falta
- O. Mielmann
- et al.
- 1998
- Applied Surface Science