SRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
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50 results for Rouwaida Kanj
A Disturb Decoupled Column Select 8T SRAM Cell
- Vinod Ramadurai
- Rajiv Joshi
- et al.
- 2007
- CICC 2007
Gate leakage effects on yield and design considerations of PD/SOI SRAM designs
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ISQED 2007
Cross layer error exploitation for aggressive voltage scaling
- Amin Khajeh Djahromi
- Ahmed M. Eltawil
- et al.
- 2007
- ISQED 2007
SRAM local bit line access failure analyses
- Praveen Elakkumanan
- Jente B. Kuang
- et al.
- 2006
- ISQED 2006
System-level SRAM yield enhancement
- Fadi J. Kurdahi
- Ahmed M. Eltawil
- et al.
- 2006
- ISQED 2006
Statistical exploration of the dual supply voltage space of a 65nm PD/SOI CMOS SRAM cell
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2006
- ESSDERC 2006
The impact of statistical leakage models on design yield estimation
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2011
- VLSI Design
A Best Balance Ratio Ordered Feature Selection Methodology for Robust and Fast Statistical Analysis of Memory Designs
- Lama Shaer
- Rouwaida Kanj
- et al.
- 2021
- IEEE TCADIS
Group LARS based Iterative Reweighted Least Squares Methodology for Efficient Statistical Modeling of Memory Designs
- Lama Shaer
- Rouwaida Kanj
- et al.
- 2021
- IEEE TCADIS