Passivation and depassivation of silicon dangling bonds at the Si/SiO 2 interface by atomic hydrogen
- E. Cartier
- J.H. Stathis
- et al.
- 1993
- Applied Physics Letters
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51 results for D.A. Buchanan
Interface defects of ultrathin rapid-thermal oxide on silicon
- J.H. Stathis
- D.A. Buchanan
- et al.
- 1993
- Applied Physics Letters
Properties of SiO2/Si/GaAs structures formed by solid phase epitaxy of amorphous Si on GaAs
- A.C. Callegari
- D.K. Sadana
- et al.
- 1991
- Applied Physics Letters
Coulombic and neutral trapping centers in silicon dioxide
- D.A. Buchanan
- M.V. Fischetti
- et al.
- 1991
- Physical Review B
Interface and bulk trap generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- D.J. DiMaria
- 1990
- Journal of Applied Physics
Trapped positive charge in plasma-enhanced chemical vapor deposited silicon dioxide films
- D.A. Buchanan
- J.H. Stathis
- et al.
- 1990
- Applied Physics Letters
Accumulation capacitance for GaAs-SiO2 interfaces with Si interlayers
- J. Freeouf
- D.A. Buchanan
- et al.
- 1990
- Applied Physics Letters
Silicon Dioxide Films Fabricated by Electron Cyclotron Resonant Microwave Plasmas
- T.T. Chau
- T.V. Herak
- et al.
- 1990
- IEEE Transactions on Electrical Insulation
Unpinned gallium oxide/GaAs interface by hydrogen and nitrogen surface plasma treatment
- A.C. Callegari
- P.D. Hoh
- et al.
- 1989
- Applied Physics Letters
Low-temperature deposition of silicon dioxide films from electron cyclotron resonant microwave plasmas
- T.V. Herak
- T.T. Chau
- et al.
- 1989
- Journal of Applied Physics