Olivier Maher, N. Harnack, et al.
DRC 2023
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Olivier Maher, N. Harnack, et al.
DRC 2023
Pritish Narayanan
VLSI Technology and Circuits 2025
Ying Zhou, Gi-Joon Nam, et al.
DAC 2023
Juan Miguel De Haro, Rubén Cano, et al.
IPDPS 2022