Yao Qi, Raja Das, et al.
ISSTA 2009
Paper
Technology Assessment
Abstract
An account is given of the evolution and use of the “minimum-linewidth method” for assessing competing integrated circuit technologies, beginning with its use in evaluating thin magnetic-film memory devices in the early 1960s and ending with its use in assessing Josephson-junction devices some twenty years later. From this account, general rules are derived for conducting successful technology assessments. © 1985 IEEE
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