Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
The ion-beam channeling technique has been used to characterize the interface and the first few layers of [100] GaSb/AlSb superlattice structures. Strain caused by alternating tensile and compressive stress has been detected by measuring the oscillation of the [110]-aligned direction with depth. From the angular displacement and its oscillation, the amount of strain in the superlattice has been determined directly. © 1983 The American Physical Society.
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
R. Ghez, J.S. Lew
Journal of Crystal Growth
J.K. Gimzewski, T.A. Jung, et al.
Surface Science