Electronic Device Failure Analysis

Paper

01 Nov 2016

Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS

Conference paper

Tuning of superconducting nanowire single-photon detector parameters for VLSI circuit testing using time-resolved emission

A. Bahgat Shehata, Franco Stellari

SPIE OPTO 2015

Conference paper

Revealing SRAM memory content using spontaneous photon emission

Franco Stellari, Peilin Song, et al.

VTS 2016

Conference paper

Testing of ultra low voltage CMOS microprocessors using the Superconducting Single-Photon Detector (SSPD)

Franco Stellari, Peilin Song

IPFA 2005

Conference paper

Revealing SRAM memory content using spontaneous photon emission

Franco Stellari, Peilin Song, et al.

VTS 2016

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