PublicationElectronic Device Failure AnalysisPaperSuperconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICSElectronic Device Failure AnalysisAbstractNo abstract availableHome↳ PublicationsDate01 Nov 2016PublicationElectronic Device Failure AnalysisAuthorsAndrea Bahgat ShehataFranco StellariPeilin SongIBM-affiliated at time of publicationShare