Naigang Wang, Bruce Doris, et al.
IEDM 2016
Paper
Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
Related
Conference paper
32nm CMOS SOI test site for emission tool evaluation
Alan J. Weger, Franco Stellari, et al.
ISTFA 2013
Franco Stellari, Keith A. Jenkins, et al.
IEEE T-ED
Uma Srinivasan, William Huott, et al.
NATW 2019