Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2016
- Electronic Device Failure Analysis
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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6 results at Electronic Device Failure Analysis
Automated high-resolution imaging of very large fields of view (FOV)
- Franco Stellari
- Chung Ching Lin
- et al.
- 2015
- Electronic Device Failure Analysis
Dual-lens electron holography for junction profiling and strain mapping on semiconductor devices
- Yun-Yu Wang
- Anthony Domenicucci
- et al.
- 2014
- Electronic Device Failure Analysis
Root-cause analysis of thin films: Selective dielectric removal for failure analysis of thin films on semiconductor devices
- Jason Benz
- William Bentley
- et al.
- 2009
- Electronic Device Failure Analysis
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis