Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
We consider the Survivable Network Design Problem (SNDP) and the Symmetric Traveling Salesman Problem (STSP). We give simpler proofs of the existence of a frac(1, 2)-edge and 1-edge in any extreme point of the natural LP relaxations for the SNDP and STSP, respectively. We formulate a common generalization of both problems and show our results by a new counting argument. We also obtain a simpler proof of the existence of a frac(1, 2)-edge in any extreme point of the set-pair LP relaxation for the element connectivitySurvivable Network Design Problem (SNDPe l t). © 2010 Elsevier B.V. All rights reserved.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
Paul J. Steinhardt, P. Chaudhari
Journal of Computational Physics
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ICLR 2023