Naga Ayachitula, Melissa Buco, et al.
SCC 2007
Design for Manufacturability (DFM) has become a major semiconductor topic that spans various issues, including issues related to lithography hardware limitations, and issues related to variability. There is, however, an issue that crosses multiple DFM domains: the need to reuse designed Silicon IP blocks or "cores" across various manufacturing processes. Unfortunately, there are no standards to facilitate the reuse of circuit blocks while addressing the lithography- and variability-related issues. Specifically, there is no clear definition for a user of a core to evaluate "manufacturability" of a core for a set of foundry processes. We present a quantitative DFM standard for Silicon IP reuse, which addresses this problem. This work was done in conjunction with VSIA's DFM team.
Naga Ayachitula, Melissa Buco, et al.
SCC 2007
Daniel J. Costello Jr., Pierre R. Chevillat, et al.
ISIT 1997
Martin Charles Golumbic, Renu C. Laskar
Discrete Applied Mathematics
Robert F. Gordon, Edward A. MacNair, et al.
WSC 1985