Rigorous testing using SnapShot

Abstract

In this paper we introduce a new testing concept called SnapShot. SnapShot is a testing mechanism which is composed of two components. The first component instruments the program with SnapShot statements which are used to produce a special trace during the program execution. The second component implements post processing on the trace. SnapShot implicitly defines a user defined coverage criteria and supports its implementation. We have applied snapshot to a variety of areas including serial, parallel and object oriented programs and VHDL designs.