Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Wide-angle X-ray diffraction (WAXD), small-angle light, light scattering and birefringence were used to investigate the temperature dependence of the morphology of poly[bis(trifluoroethoxy)phosphazene]. Experiments conducted on solution cast films revealed a spherulitic morphology in the range 25-225 °C. Structural changes, associated with the transformation to the mesomorphic state, were found to occur in the temperature range 70-90 °C. Above the melting point, the material was isotropic by optical techniques and amorphous by WAXD. The results are discussed in terms of changes in molecular ordering. © 1984, American Chemical Society. All rights reserved.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Michiel Sprik
Journal of Physics Condensed Matter