Conference paper
A privacy-protecting coupon system
Liqun Chen, Matthias Enzmann, et al.
FC 2005
A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.
Liqun Chen, Matthias Enzmann, et al.
FC 2005
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Ohad Shamir, Sivan Sabato, et al.
Theoretical Computer Science
Hendrik F. Hamann
InterPACK 2013