Rolf Clauberg
IBM J. Res. Dev
A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.
Rolf Clauberg
IBM J. Res. Dev
Raghu Krishnapuram, Krishna Kummamuru
IFSA 2003
Ziyang Liu, Sivaramakrishnan Natarajan, et al.
VLDB
Limin Hu
IEEE/ACM Transactions on Networking