Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits

H. Heinrich; N. Pakdaman; J.L. Prince; D. Kent; L. Cropp

doi:10.1016/0167-9317(92)90352-R

Microelectronic Engineering

Paper

01 Jan 1992

Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits

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Abstract

We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated. © 1992.

Paper