Optical measurement of internal logic patterns in a flip-chip mounted silicon SRAM integrated circuit
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- LEOS 1992
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2 results for J.L. Prince
Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- Microelectronic Engineering