Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Photolithography using 193-nm light appears to be a viable route for the extension of optical lithography to the dimensions required for the manufacture of 1Gb DRAM and advanced CMOS microprocessors with 180-140-nm minimum feature sizes. In this paper, we discuss the origin of resist technology for 193-nm lithography and the current status of 193-nm photoresists, focusing on single-layer resist materials. We emphasize the photoresist design approaches under investigation, compare these with deep-UV (DUV) (248-nm) resist design and materials, and consider possible future lithography processes employing 193-nm lithography. Research and development on 193-nm photoresists by the lithography group at the IBM Almaden Research Center is highlighted.
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
M.J. Slattery, Joan L. Mitchell
IBM J. Res. Dev
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007