Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008
Photolithography using 193-nm light appears to be a viable route for the extension of optical lithography to the dimensions required for the manufacture of 1Gb DRAM and advanced CMOS microprocessors with 180-140-nm minimum feature sizes. In this paper, we discuss the origin of resist technology for 193-nm lithography and the current status of 193-nm photoresists, focusing on single-layer resist materials. We emphasize the photoresist design approaches under investigation, compare these with deep-UV (DUV) (248-nm) resist design and materials, and consider possible future lithography processes employing 193-nm lithography. Research and development on 193-nm photoresists by the lithography group at the IBM Almaden Research Center is highlighted.
Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008
N.K. Ratha, A.K. Jain, et al.
Workshop CAMP 2000
Nanda Kambhatla
ACL 2004
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum