Sung Ho Kim, Oun-Ho Park, et al.
Small
A grain-boundary-dislocation mechanism for diffusion-induced boundary migration is proposed. It is suggested that point-defect emission from grain-boundary dislocations is necessary for the solution and transport of substitutional solutes. Grain-boundary migration occurs as a by-product of the emission of point defects, owing to the requirement that the dislocation remain in the grain-boundary plane. © 1981 Taylor & Francis Group, LLC.
Sung Ho Kim, Oun-Ho Park, et al.
Small
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
A. Reisman, M. Berkenblit, et al.
JES