Rachel J. Cannara, Abu Sebastian, et al.
IEEE TNANO
We report the design, fabrication, and characterization of cantilevers with integrated AlN actuators and conductive PtSi tips for multi-frequency atomic force microscopy. These cantilevers also possess a stepped-rectangular geometry. The excellent dynamic behavior of these cantilevers is investigated using both finite-element simulations and experimental methods. Several imaging experiments are presented to illustrate the efficacy and versatility of these cantilevers. © 2012 American Institute of Physics.
Rachel J. Cannara, Abu Sebastian, et al.
IEEE TNANO
Angeliki Pantazi, Abu Sebastian, et al.
IEEE TCST
H. Pozidis, Nikolaos Papandreou, et al.
IMW 2013
Angeliki Pantazi, Abu Sebastian, et al.
IEEE CDC-ECC 2005