New scanning probe microscopies: status and prospects

Abstract

With proper instrumental modifications, an STM not only provides information on topography and electron spectra but also on electrical and chemical potential distributions, interfacial forces, etc. Further, interactions ('X') between stylus and object different from tunneling ('T') allow to implement a number of complementary microscopies ('SXM') which are capable to highlight different properties in a scan image. Cross sectional SXM studies of GaAs/AlGaAs epitactical multilayers are chosen as example.