William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on the grid reduces noise margin and increases gate delay, resulting in a serious performance impact. Checking the integrity of the supply voltage using traditional circuit simulation is not practical, for reasons of time and memory complexity. We propose a novel multigrid-like technique for the analysis of power grids. The grid is reduced to a coarser structure, and the solution is mapped back to the original grid. Experimental results show that the proposed method is very efficient as well as suitable for both DC and transient analysis of power grids.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Yigal Hoffner, Simon Field, et al.
EDOC 2004
B.K. Boguraev, Mary S. Neff
HICSS 2000
Pradip Bose
VTS 1998