G. Srajer, L.H. Lewis, et al.
Journal of Magnetism and Magnetic Materials
Magnetic and chemical heterogeneity are common in a broad range of magnetic thin film systems. Emerging resonant soft X-ray scattering techniques are well suited to resolve such heterogeneity at relevant length scales. Resonant X-ray magneto-optical Kerr effect measurements laterally average over heterogeneity but can provide depth resolution in different ways, as illustrated in measurements resolving reversible and irreversible changes in different layers of exchange-spring heterostructures. Resonant small-angle scattering measures in-plane heterogeneity and can resolve magnetic and chemical scattering sources in different ways, as illustrated in measurements of granular alloy recording media. © 2002 Elsevier Science B.V. All rights reserved.
G. Srajer, L.H. Lewis, et al.
Journal of Magnetism and Magnetic Materials
S.D. Bader, Stuart Stephen Papworth Parkin
Annu. Rev. Condens. Matter Phys.
L.M. Falicov, Daniel T. Pierce, et al.
Journal of Materials Research
G. Srajer, L.H. Lewis, et al.
Journal of Magnetism and Magnetic Materials