Publication
IEEE TC
Paper

Functional Fault Simulation as a Guide for Biased-Random Test Pattern Generation

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Abstract

We present an approach to the generation of test patterns for implementation level faults, using fault simulation on a functional level description of a combinational VLSI design, together with an appropriate functional fault model. Our methodology uses the difference fault model (DFM), a formal abstraction of the faults at the implementation level, as the basis for fault simulation at the functional level. Incremental information from fault simulation results provides guidance for the generation of nonuniformly distributed random test patterns using a backtracing process. The quality of the generated patterns is measured in terms of their coverage of implementation faults. © 1991 IEEE

Date

01 Jan 1991

Publication

IEEE TC

Authors

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