A. Gangulee, F.M. D'Heurle
Thin Solid Films
Angle-resolved photoelectron spectroscopy using synchrotron radiation has been used to determine energy band dispersions along the ΓKX and ΓX directions in nickel. A detailed picture of spin-dependent energy levels and band topology around the symmetry point X has been derived. We have measured the exchange splitting for different band symmetries and find the splitting for the X2-S4 band along (110) to be 0.17 eV. For the X5-S3 band we find a splitting of 0.33 eV which is in close agreement with the value found earlier for the Σ2 band. This can be explained by different self-energy corrections for t2g and eg-type states respectively. Our values for the energy positions (inverse lifetimes) are the following: X2↓ = -0.04 eV (0.08 eV, X2↑ = -0.24 eV (0.19 eV), X5↑ = -0.11 eV. © 1981.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
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