Electron microscope investigation of the structural behavior of halogenated (SN)_x

Abstract

Suitably prepared specimens of polymeric sulfur nitride modified by Br2 and ICl have been studied by transmission electron microscopy. Electron diffraction patterns indicate the two species are accomodated differently by the host lattice. In both cases the creation of a superlattice structure is indicated. In situ heating and cooling from ambient show changes in the diffraction patterns suggesting that each of the halogens may be packed differently in two modes along the chains of the parent polymer. In both cases exposure of pristine (SN)x to the halogen gas resulted in extreme microtwinning, as seen by high resolution dark field imaging and the extended streaks formed by the electron diffraction spots. © 1980.