SPIE Optical Science, Engineering, and Instrumentation 1995
Conference paper

Electron-beam microcolumn technology and applications


A fully functional electron beam microcolumn, 3.5 mm in length, demonstrating a probe size of 10 nm and beam current ≥ 1 nA at 1 keV has been successfully developed. This paper presents its current status and future directions. Potential applications ranging from low cost scanning electron microscopy to arrays of such microcolumns for lithography, metrology, testing etc. will be discussed.