Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The normal force acting on a scanning tunneling microscope tip while imaging a graphite surface in air has been measured directly. Forces in the range of 10-7 to 10-6 N are required to achieve tunneling. Further, the force needed to maintain a constant current varies considerably as the tip scans from one part of the graphite unit cell to another. Our results are consistent with a model, originally suggested by Mamin et al., in which the force between the tip and the surface is mediated by a contamination layer, and tunneling occurs at the end of an asperity which pierces this layer. However, we cannot rule out a model where a graphite flake is dragged across the graphite surface to generate an STM image. © 1989.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
T.N. Morgan
Semiconductor Science and Technology
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings