Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained from measuring shifts of the resonance frequency, which provides information on conservative interactions, and of the Q-factor, which is sensitive to dissipative interactions. Problems associated with interaction sensing are discussed from a theoretical and an experimental point of view.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Hiroshi Ito, Reinhold Schwalm
JES
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications