I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures