J.K. Gimzewski, T.A. Jung, et al.
Surface Science
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
A. Reisman, M. Berkenblit, et al.
JES
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B