About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
ICST 2012
Conference paper
Common patterns in combinatorial models
Abstract
Combinatorial test design (CTD) is an effective test planning technique that systematically exercises interactions between parameters of the test space. The test space is manually modeled by a set of parameters, their respective values, and restrictions on the value combinations. A subset of the test space is then automatically constructed so that it covers all valid value combinations of every parameters, where is a user input. This paper describes patterns that we have found to be recurring in combinatorial models, i.e., recurring properties of the modeled test spaces. These patterns are often hard to identify and capture correctly in a model, thus are common pitfalls in combinatorial modeling. We describe these patterns, supply methods for identifying them, and suggest simple yet effective solutions for them. © 2012 IEEE.