Daniel M. Bikel, Vittorio Castelli
ACL 2008
It is possible under favorable circumstances to identify composition, bonding, and electronic structure with atomic resolution in microelectronic device structures. In current device structures, where only a few interface atoms can dominate the performance of a device, this can contribute important understanding relevant to product development. This paper is a brief overview of work in our laboratory using scanning transmission electron microscopy to achieve such capabilities.
Daniel M. Bikel, Vittorio Castelli
ACL 2008
Beomseok Nam, Henrique Andrade, et al.
ACM/IEEE SC 2006
Minkyong Kim, Zhen Liu, et al.
INFOCOM 2008
Nanda Kambhatla
ACL 2004