An ultrahigh vacuum scanning tunneling microscope with interchangeable samples and tips

Abstract

Our ultrahigh vacuum scanning tunneling microscope (STM) is the first instrument in which both the samples and tips can be replaced in situ and analyzed by routine surface analysis techniques. The STM chamber is connected by a transfer chamber to a VG Escalab surface analysis system equipped with scanning Auger microscopy/scanning electron microscopy, x-ray photoemission spectroscopy, low-energy electron diffraction, and sample cleaning and preparation facilities. We describe the design of the instrument in detail and show high-resolution data which exemplify its performance and lead to determinations of the structure of several surfaces: (V3 xfi)R 30° Ag/Si(111), (19 × 19)R 23.4°Ni/Si (111),and Au(111) thin films on mica. © 1988, American Vacuum Society. All rights reserved.