Conference paperDevelopment of a novel ion time-of-flight spectrometer for neutron depth profilingSacit M. Cetiner, Rudolph Tromp, et al.ANS Annual Conference 2008
Paper32 and 45 nm radiation-hardened-by-design (RHBD) SOI latchesKenneth P. Rodbell, David F. Heidel, et al.IEEE TNS
Conference paperAn on-chip jitter measurement circuit with sub-picosecond resolutionKeith A. Jenkins, Anup P. Jose, et al.ESSCIRC 2005
