Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing
- Jeffrey D. Wilkinson
- Brett M. Clark
- et al.
- 2011
- IRPS 2011
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6 results for Brendan D. McNally
Sources of variability in alpha emissivity measurements at la and ULA levels, a multicenter study
- Brendan D. McNally
- Stuart Coleman
- et al.
- 2014
- Nucl. Instrum. Methods Phys. Res
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Alpha-particle emission energy spectra from materials used for solder bumps
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE TNS
An evaluation of an ultralow background alpha-particle detector
- Michael S. Gordon
- David F. Heidel
- et al.
- 2009
- IEEE TNS