Conference paper
Hardness assurance testing for proton direct ionization effects
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions. © 2006 IEEE.
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
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IEEE TNS
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IEEE TNS
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