Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Crossover events for a linear programming problem were introduced by Vavasis and Ye and provide important insight into the behavior of the path of centers. The complexity of a layered-step interior-point algorithm presented by them depends on the number of disjoint crossover events and the coefficient matrix A, but not on b and c. In this short note, we present a linear programming instance with more than n2/8 disjoint crossover events. © 1996 Academic Press, Inc.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Imran Nasim, Michael E. Henderson
Mathematics
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence